A Survey on Matrix Based Error Detection and Correction Codes

International Journal of Electrical and Electronics Engineering |
© 2025 by SSRG - IJEEE Journal |
Volume 12 Issue 2 |
Year of Publication : 2025 |
Authors : Kavya Cherakula, Varadarajan Sourirajan |
How to Cite?
Kavya Cherakula, Varadarajan Sourirajan, "A Survey on Matrix Based Error Detection and Correction Codes," SSRG International Journal of Electrical and Electronics Engineering, vol. 12, no. 2, pp. 146-156, 2025. Crossref, https://doi.org/10.14445/23488379/IJEEE-V12I2P116
Abstract:
Semiconductor memories are prone to various types of faults, such as stuck-at faults, memory faults, etc, that manifest as errors. As the data is usually stored in the memory in matrix form, the error correction capability is maximised by using Matrix codes with a minimal number of parity bits and improvement in code rate. The survey of codes extracted include MPC, 3D, HVD, HVDD, DMC, MDMC, PMC, HDMC, OPC, PrMC and MPrMC codes. The results are obtained by modeling in Verilog HDL using Xilinx Vivado Tool 28nm Zynq FPGA (XC7Z100-2FFG1156). These methods are evaluated for redundant bits, code rate, area in terms of LUTs, power dissipation, delay, etc. The MPrMC method – 2 Code uses reduced bit overhead by atleast 25.77% to 70.59%, increases code rate by 8.38% to 57.16%, decreases area occupied by 45.98% to 52.04% for encoder, 7.43% to 13.37% for decoder, decreases PDP by 19.69% to 51.74% for encoder and 33.67% to 40.97% for decoder. Hence, the MPrMC code proves to be a better choice in all aspects but trades off the area utilised.
Keywords:
Code rate, Errors, Faults, Matrix codes, Radiation, Redundant bits.
References:
[1] Andrés Jiménez Olazábal, and Jorge Pleite Guerra, “Multiple Cell Upsets Inside Aircrafts. New Fault-Tolerant Architecture,” IEEE Transactions on Aerospace and Electronic Systems, vol. 55, no. 1, pp. 332-342, 2019.
[CrossRef] [Google Scholar] [Publisher Link]
[2] Joaquín Gracia-Morán et al., “Improving Error Correction Codes for Multiple-Cell Upsets in Space Applications,” IEEE Transactions on Very Large Scale Integration Systems, vol. 26, no. 10, pp. 2132-2142, 2018.
[CrossRef] [Google Scholar] [Publisher Link]
[3] “1890-2018 - IEEE Standard for Error Correction Coding of Flash Memory Using Low-Density Parity Check Codes,” IEEE, pp. 1-51, 2019.
[CrossRef] [Google Scholar] [Publisher Link]
[4] Jagannath Samanta, Jaydeb Bhaumik, and Soma Barman, “Compact and Power Efficient SEC-DED Codec for Computer Memory,” Microsystem Technologies, vol. 27, pp. 359-368, 2021.
[CrossRef] [Google Scholar] [Publisher Link]
[5] Abdullah Mohammed A. Hamdoon, Zaid Ghanim Mohammed, and Emad A. Mohammed, “Design and Implementation of Single Bit Error Correction Linear Block Code System Based on FPGA,” TELKOMNIKA Telecommunication, Computing, Electronics and Control, vol. 17, no. 4, 2019.
[CrossRef] [Google Scholar] [Publisher Link]
[6] Shanshan Liu et al., “Fault Tolerant Encoders for Single Error Correction and Double Adjacent Error Correction Codes,” Microelectronics Reliability, vol. 81, pp. 167-173, 2018.
[CrossRef] [Google Scholar] [Publisher Link]
[7] Alfonso Sánchez-Macián, Pedro Reviriego, and Juan Antonio Maestro, “Hamming SEC-DAED and Extended Hamming SEC-DED-TAED Codes through Selective Shortening and Bit Placement,” IEEE Transactions on Device and Materials Reliability, vol. 14, no. 1, pp. 574-576, 2014.
[CrossRef] [Google Scholar] [Publisher Link]
[8] Avijit Dutta, and Nur A. Touba, “Multiple Bit Upset Tolerant Memory Using a Selective Cycle Avoidance Based SEC-DED-DAEC Code,” 25th IEEE VLSI Test Symposium, Berkeley, CA, USA, pp. 349-354, 2007.
[CrossRef] [Google Scholar] [Publisher Link]
[9] Pedro Reviriego et al., “A Method to Design SEC-DED-DAEC Codes with Optimized Decoding,” IEEE Transactions on Device Material Reliability, vol. 14, no. 3, pp. 884-889, 2014.
[CrossRef] [Google Scholar] [Publisher Link]
[10] Wei Zhou et al., “Designing Scrubbing Strategy for Memories Suffering MCUs through the Selection of Optimal Interleaving Distance,” International Journal of Computational Science and Engineering, vol. 19, no. 1, pp. 53-63, 2019.
[CrossRef] [Google Scholar] [Publisher Link]
[11] Costas Argyrides, Dhiraj K. Pradhan, and Taskin Kocak, “Matrix Codes for Reliable and Cost Efficient Memory Chips,” IEEE Transactions on Very Large Scale Integration Systems, vol. 19, no. 3, pp. 420-428, 2011.
[CrossRef] [Google Scholar] [Publisher Link]
[12] M.S. Sunita, and V.S. Kanchana Bhaaskaran, “Matrix Code Based Multiple Error Correction Technique for N-Bit Memory Data,” International Journal of VLSI Design & Communication Systems, vol. 4, no. 1, pp. 29-37, 2013.
[Google Scholar] [Publisher Link]
[13] Joaquín Gracia-Moran et al., “Correction of Adjacent Errors with Low Redundant Matrix Error Correction Codes,” Eighth Latin-American Symposium on Dependable Computing, Foz do Iguacu, Brazil, pp.107-114, 2018.
[CrossRef] [Google Scholar] [Publisher Link]
[14] Vishal Badole, and Amit Udawa, “Implementation of Multidirectional Parity Check Code Using Hamming Code for Error Detection and Correction,” International Journal of Research in Advent Technology, vol. 2, no. 5, pp. 317-322, 2014.
[Google Scholar] [Publisher Link]
[15] Shivani Tambatkar et al., “Error Detection and Correction in Semiconductor Memories Using 3D Parity Check Code with Hamming Code,” International Conference on Communication and Signal Processing, Chennai, India, vol. 2, pp. 0974-0978, 2017.
[CrossRef] [Google Scholar] [Publisher Link]
[16] T. Maheswari, and P. Sukumar, “Error Detection and Correction in SRAM Cell Using Decimal Matrix Code,” IOSR Journal of VLSI and Signal Processing, vol. 5, no. 1, pp. 9-14, 2015.
[Google Scholar] [Publisher Link]
[17] Jing Guo et al., “Enhanced Memory Reliability Against Multiple Cell Upsets Using Decimal Matrix Code,” IEEE Transactions on Very Large Scale Integration Systems, vol. 22, no. 1, pp. 127-135, 2014.
[CrossRef] [Google Scholar] [Publisher Link]
[18] A. Ahilan, and P. Deepa, “Modified Decimal Matrix Codes in FPGA Configuration Memory for Multiple Bit Upsets,” International Conference on Computer Communication and Informatics, Coimbatore, India, pp. 1-5, 2015.
[CrossRef] [Google Scholar] [Publisher Link]
[19] S. Manoj, and C. Babu, “Improved Error Detection and Correction for Memory Reliability Against Multiple Cell Upsets Using DMC and PMC,” IEEE Annual India Conference, Bangalore, India, pp.1-6, 2016.
[CrossRef] [Google Scholar] [Publisher Link]
[20] Shalini Sharma, and P. Vijayakumar, “An HVD Based Error Detection and Correction of Soft Errors in Semiconductor Memories Used for Space Applications,” International Conference on Devices, Circuits and Systems, Coimbatore, India, pp. 563-567, 2012.
[CrossRef] [Google Scholar] [Publisher Link]
[21] Md. Shamimur Rahman et al., “Soft Error Tolerance Using Horizontal-Vertical-Double-Bit Diagonal Parity Method,” International Conference on Electrical Engineering and Information Communication Technology, Savar, Bangladesh, pp. 1-6, 2015.
[CrossRef] [Google Scholar] [Publisher Link]
[22] Wael Toghuj, “Modifying Hamming Code and Using the Replication Method to Protect Memory Against Triple Soft Errors,” TELKOMNIKA Telecommunication, Computing, Electronics and Control, vol. 18, no. 5, 2020.
[CrossRef] [Google Scholar] [Publisher Link]
[23] Shovon Dey, Aurangozeb, and Masum Hossain, “Low-Latency Burst Error Detection and Correction in Decision-Feedback Equalization,” IEEE Open Journal of Circuits and Systems, vol. 2, pp. 91-100, 2021.
[CrossRef] [Google Scholar] [Publisher Link]
[24] Jiaqiang Li et al., “Extending 3-Bit Burst Error-Correction Codes with Quadruple Adjacent Error Correction,” IEEE Transactions on Very Large Scale Integration Systems, vol. 26, no. 2, pp. 221-229, 2018.
[CrossRef] [Google Scholar] [Publisher Link]
[25] J. Athira, and B. Yamuna. “FPGA Implementation of an Area Efficient Matrix Code with Encoder Reuse Method,” International Conference on Communication and Signal Processing, Chennai, India, pp. 0254-0257, 2018.
[CrossRef] [Google Scholar] [Publisher Link]
[26] Luis-J. Saiz-Adalid et al., “Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection,” IEEE Access, vol. 7, pp. 151131-151143, 2019.
[CrossRef] [Google Scholar] [Publisher Link]
[27] T.A. Gulliver, and V.K. Bhargava, “A Systematic (16, 8) Code for Correcting Double Errors and Detecting Triple Adjacent Errors,” IEEE Transactions on Computers, vol. 42, no. 1, pp. 109-112, 1993.
[CrossRef] [Google Scholar] [Publisher Link]
[28] Neelima K, and C. Subhas, “Half Diagonal Matrix Codes for Reliable Embedded Memories,” International Journal of Health Sciences, vol. 6, no. S2, pp. 11664-11677, 2022.
[CrossRef] [Google Scholar] [Publisher Link]
[29] Neelima Koppala, and Chennapalli Subhas, “Low Overhead Optimal Parity Codes,” TELKOMNIKA Telecommunication Computing Electronics and Control, vol. 20, no. 3, 2022.
[CrossRef] [Google Scholar] [Publisher Link]
[30] Neelima K, and C. Subhas, “Proficient Adjacent Error Correcting Codes,” IEEE 3rd International Conference on Applied Electromagnetics, Signal Processing, & Communication, Bhubaneswar, India, pp. 1-5, 2023.
[CrossRef] [Google Scholar] [Publisher Link]
[31] Neelima K, C. Subhas, “Modified Proficient Adjacent Error Correcting Codes,” e-Prime - Advances in Electrical Engineering, Electronics and Energy, vol. 5, 2023.
[CrossRef] [Google Scholar] [Publisher Link]
[32] Neelima Koppala et al., “Proficient Matrix Codes for Error Detection and Correction in 8-Port Network on Chip Routers,” Indonesian Journal of Electrical Engineering and Computer Science, vol. 29, no. 3, pp. 1336-1344, 2023.
[CrossRef] [Google Scholar] [Publisher Link]
[33] Neelima K, C. Subhas, “Modified Matrix Codes for Shielding Memories Against Adjacent Errors,” ASEAN Engineering Journal, vol. 14, no. 2, pp. 19-25, 2024.
[CrossRef] [Google Scholar] [Publisher Link]